28 April 2011 An extended model for electrostatic tractions at crack faces in piezoelectrics
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Abstract
Recently, the theoretical framework of fracture mechanics of piezoelectrics has been extended to include electrostatically induced mechanical tractions in crack models yielding a significant crack closure effect.1-3 However, these models are still simple, neglecting e.g. the piezoelectric field coupling. In this work, an extended model for crack surface tractions is presented yielding some interesting effects. In particular, it is predicted that the Mode-I stress intensity factor is influenced by both a collinear normal stress parallel to the crack faces and a Mode-II shear loading. Also, the direction of electric field vs. poling direction is clearly manifested in the calculated crack loading quantities.
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Andreas Ricoeur, Andreas Ricoeur, Roman Gellmann, Roman Gellmann, } "An extended model for electrostatic tractions at crack faces in piezoelectrics", Proc. SPIE 7978, Behavior and Mechanics of Multifunctional Materials and Composites 2011, 79780L (28 April 2011); doi: 10.1117/12.878838; https://doi.org/10.1117/12.878838
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