Characterization and compaction of Lamb wave data using a combination of S and wavelet transformations

Ibrahim N. Tansel; Gurjiwan Singh; Gurjashan Singh; Srikanth Korla; Benjamin L. Grisso; Liming W. Salvino

doi:10.1117/12.880436

15 April 2011 Characterization and compaction of Lamb wave data using a combination of S and wavelet transformations

Ibrahim N. Tansel, Gurjiwan Singh, Gurjashan Singh, Srikanth Korla, Benjamin L. Grisso, Liming W. Salvino

Proceedings Volume 7982, Smart Sensor Phenomena, Technology, Networks, and Systems 2011; 798215 (2011) https://doi.org/10.1117/12.880436
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2011, San Diego, California, United States

Abstract

During the interpretation of the Lamb wave data, the main concern is often the arrival times of wave groups. Group arrival times determine the distance of the source or the reflector. The inspection of sensory signal envelopes is satisfactory to identify and localize defects. The S-transformation is proposed for isolating wave forms at their excitation frequency and obtaining their envelopes. To further minimize the storage and computational costs, reduction of the data size by down sampling (skipping 5 data points for each saved one) and compression via calculating the wavelet transformation three times are proposed. The data was reduced to 1/30th of its original size, while the reconstructed wavelet transformation had a less than 1% average error with respect to the down sized envelope signal.

Citation Download Citation

Ibrahim N. Tansel, Gurjiwan Singh, Gurjashan Singh, Srikanth Korla, Benjamin L. Grisso, and Liming W. Salvino "Characterization and compaction of Lamb wave data using a combination of S and wavelet transformations", Proc. SPIE 7982, Smart Sensor Phenomena, Technology, Networks, and Systems 2011, 798215 (15 April 2011); https://doi.org/10.1117/12.880436

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Wavelets

Sensors

Aluminum

Data storage

Error analysis

Structural health monitoring

Data analysis

Show All Keywords

Keywords/Phrases

Search In:

Publication Years