The link between wafer manufacturing and wafer test is often weak: without common information system, Test
engineers have to read locations of test structures from reference documents and search them on the wafer prober screen.
Mask Data Preparation team is ideally placed to fill this gap, given its relationship with both design and manufacturing
sides. With appropriate design extraction scripts and design conventions, mask engineers can provide exact wafer
locations of all embedded test structures to avoid a painful camera search. Going a step further, it would be a great help
to provide to wafer probers a "map" of what was build on wafers. With this idea in mind, mask design database can
simply be provided to Test engineers; but the real added value would come from a true integration of real-wafer camera
views and design database used for wafer manufacturing. As proven by several augmented reality applications, like
Google Maps' mixed Satellite/Map view, mixing a real-world view with its theoretical model is very useful to
understand the reality. The creation of such interface can only be made by a wafer prober manufacturer, given the high
integration of these machines with their control panel. But many existing software libraries could be used to plot the
design view matching the camera view. Standard formats for mask design are usually GDSII and OASIS (SEMI P39
standard); multiple free software and commercial viewers/editors/libraries for these formats are available.