Paper
11 January 2011 Raman and infrared spectroscopy of organic electronic devices
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Proceedings Volume 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics; 799320 (2011) https://doi.org/10.1117/12.880237
Event: International Conference on Coherent and Nonlinear Optics (ICONO 2010) and International Conference on Lasers, Applications and Technologies (LAT 2010), 2010, Kazan, Russian Federation
Abstract
We present Raman and infrared studies on the structures of organic semiconductor thin films used for electronic devices. The Raman spectra of crystalline and amorphous states of an organic semiconductor, N,N'-di-1-naphthaleyl-N,N'-diphenyl-1,1'-biphenyl-4,4'-diamine (NPD), were measured. These states give rise to slightly different peak positions and widths of each Raman band. Raman images were observed for polycrystalline pentacene films evaporated on a silicon substrate. The structural defects were found in the images of the intensity ratio I1596/I1533, which reflects the orientation of molecules i.e., crystalline domains. Photoinduced infrared absorption from the composite of regioregular poly(3-dodecylthiphene) and C60 was measured by the difference FT-IR method. The observed absorption is attributable to photogenerated carriers. The action spectra of photoinduced infrared absorption are explained by electron transfer from photogenerated excited states on a polymer chain to C60.
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Y. Furukawa "Raman and infrared spectroscopy of organic electronic devices", Proc. SPIE 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics, 799320 (11 January 2011); https://doi.org/10.1117/12.880237
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KEYWORDS
Raman spectroscopy

Thin films

Absorption

Infrared radiation

Crystals

Infrared spectroscopy

Infrared photography

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