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18 February 2011 Effects of texture on the properties of polycrystalline HgI2 films
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Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 79951L (2011) https://doi.org/10.1117/12.888212
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China
Abstract
Due to different oriented polycrystalline HgI2 films show different properties. In this paper the properties of different oriented HgI2 films have been investigated by scanning electron microscopy, X-ray diffraction and current-voltage measurements. The measured results indicate HgI2 films are of high quality and the properties of the (001)-oriented HgI2 film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI2 film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI2 film keeps unchanged during measurement.
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Weimin Shi, Qingfeng Su, Dongmin Li, Linjun Wang, Haokun Hu, and Yiben Xia "Effects of texture on the properties of polycrystalline HgI2 films", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951L (18 February 2011); https://doi.org/10.1117/12.888212
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