Paper
18 February 2011 1Effects of sputter power, gas pressure and substrate temperature on the structure and optical properties of CdS thin films
Weiming Gong, Run Xu, Jian Huang, Minyan Tang, Lin-jun Wang, Meng Cao
Author Affiliations +
Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 79952C (2011) https://doi.org/10.1117/12.888273
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China
Abstract
CdS is deposited on transparent conductive oxide (TCO)-coated glass substrate by radio frequency (r.f.) magnetron sputtering method. The X-ray diffraction (XRD) measurements revealed that CdS films were polycrystalline with the hexagonal wurtzite structure present only. The same conclusions as described below are arrived at from the photoluminescence (PL) and UV-vis absorption spectra measurements. When the power increases or the gas pressure decreases, the grain size and the film thickness increases, and then lead to the increase of stress in films which results in the decrease of energy band gap. The substrate temperature also has an effect on the strain in the films.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weiming Gong, Run Xu, Jian Huang, Minyan Tang, Lin-jun Wang, and Meng Cao "1Effects of sputter power, gas pressure and substrate temperature on the structure and optical properties of CdS thin films", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79952C (18 February 2011); https://doi.org/10.1117/12.888273
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KEYWORDS
Cadmium sulfide

Thin films

Sputter deposition

Absorption

Glasses

Optical properties

Scanning electron microscopy

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