Resistance is one of four basic parameters of quartz crystal, and the others can be deducted from it. However, its strict
requirements on fabrication technology for π network, and the phase shift induced by tray reactance and quartz crystal
static capacitance, the highest accuracy measurements of resistance is difficult to be realized. Here, active compensation
to additional-phase offset induced by stray reactance in π network and quartz crystal static capacitance (C0) is presented,
which facilitates measurement of resistance of quartz crystal, and reduces the requirements of fabrication technology for
π network. The experimental result indicates that the measurement accuracy of resistance R1 in quartz crystal can be up
to ±5% with this measurement system.
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