Paper
26 July 2011 Mode-locked diode laser for long distance precision metrology
Manuel Abreu, David Castro Alves, Alexandre Cabral, José M. Rebordão
Author Affiliations +
Proceedings Volume 8001, International Conference on Applications of Optics and Photonics; 80010L (2011) https://doi.org/10.1117/12.890752
Event: International Conference on Applications of Optics and Photonics, 2011, Braga, Portugal
Abstract
High precision measurements of long distances for intrasatellite ranging have very specific requirements and constraints. In particular, performance parameters like accuracy, ambiguity range, update rate, complexity, weight and flexibility are of great relevance for space missions. The baseline of optical laser metrologies for distance measurement in space relies on diode pumped Nd:YAG NPRO (Non-Planar Ring Oscillator) lasers with significant demands on power, mass, and cost. Semiconductor diode lasers represent one option, offering compactness, integrability and flexibility, but the current drawback of this technology is the non-availability of frequency-stable laser diodes, either CW or pulsed. In this paper we present a new metrology concept based on quantum dot modelocked diode laser with relaxed requirements in terms of frequency stability, that can meet the specifications of a metrology system for intrasatellite distances up to 250m with accuracies better than 100 micrometers.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Manuel Abreu, David Castro Alves, Alexandre Cabral, and José M. Rebordão "Mode-locked diode laser for long distance precision metrology", Proc. SPIE 8001, International Conference on Applications of Optics and Photonics, 80010L (26 July 2011); https://doi.org/10.1117/12.890752
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Semiconductor lasers

Distance measurement

Metrology

Mode locking

Oscillators

Ranging

Systems modeling

Back to Top