31 August 2011 Waveguide crossing characterization for silica planar lightwave circuits
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Proceedings Volume 8007, Photonics North 2011; 80070P (2011) https://doi.org/10.1117/12.902933
Event: Photonics North 2011, 2011, Ottawa, Canada
Abstract
Optical waveguide crossings based on silica-on-silicon technology are investigated. The effect of crossing angle (θ) on light transmitted at through and cross-port on a sequence of waveguide crossings with angle varying from 7 to 28° is modeled and experimentally validated. Results demonstrate that structures with small footprint (θ≈9°) can achieve low crosstalk of -32 dB with high throughput, insensitivity to wavelength of operation, low polarization dependent loss of 0.6 dB, and low sensitivity to fabrication tolerances. As a result, waveguide crossings with small crossing angle present an attractive approach to reducing the overall component footprint without compromising the performance.
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D. Celo, D. Celo, P. Dumais, P. Dumais, S. Paquet, S. Paquet, J. Seregelyi, J. Seregelyi, C. Callender, C. Callender, } "Waveguide crossing characterization for silica planar lightwave circuits", Proc. SPIE 8007, Photonics North 2011, 80070P (31 August 2011); doi: 10.1117/12.902933; https://doi.org/10.1117/12.902933
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