8 July 2011 A component inspection algorithm based on low-dimensional image feature
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Proceedings Volume 8009, Third International Conference on Digital Image Processing (ICDIP 2011); 80092Z (2011) https://doi.org/10.1117/12.896272
Event: 3rd International Conference on Digital Image Processing, 2011, Chengdu, China
Abstract
The images captured by image-array-based automatic optical inspection devices may be inconsistent in lightness, definition and uniformity, which greatly influence the accuracy of the inspection result. To solve such a problem, a component inspection algorithm based on low-dimensional image feature is proposed. It doesn't compare inspected image with standard image from pixel to pixel like traditional algorithms do. Instead it compares key image feature extracted from the image by designing feature functions and computing attributes. The essential of the algorithm is to transfer the original high-dimensional information contained within the image to one-dimensional feature data. Experiments show that the algorithm can ensure efficient and low-storage real-time component inspection.
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Jianjie Wu, Jianjie Wu, Yuhui Zhang, Yuhui Zhang, } "A component inspection algorithm based on low-dimensional image feature", Proc. SPIE 8009, Third International Conference on Digital Image Processing (ICDIP 2011), 80092Z (8 July 2011); doi: 10.1117/12.896272; https://doi.org/10.1117/12.896272
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