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21 October 2011 Characterization of planar waveguides fabricated by multiple sol-gel dip-coatings
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Planar step-index waveguides of SiO2:TiO2 and ZrO2:CeO2 in multilayer structures were prepared onto commercial glass substrates using a sol-gel technique combined with dip-coating. These coatings were previously optically characterized by Ellipsometry. These glassy coatings were structural characterized by Transmission Electron Microscopy (TEM), Energy Dispersive X-ray analysis and Confocal Microscopy. Thicknesses of 1050 nm and 500 nm and refractive indices of 1.64 and 2.07 for SiO2:TiO2 (70:30) and ZrO2:CeO2 (70:30) waveguides were obtained, respectively, by the analysis of the guided TE and TM modes observed by Dark m-line Spectroscopy. Losses of 1.32 dB/cm and 0.86 dB/cm were respectively measured by a method based on scattered light.
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F. Rey-García, C. Gómez-Reino, M. T. Flores-Arias, G. F. De La Fuente, W. Assenmacher, W. Mader, S. Berneschi, S. Pelli, G. Nunzi Conti, and G. C. Righini "Characterization of planar waveguides fabricated by multiple sol-gel dip-coatings", Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80110R (21 October 2011);

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