Translator Disclaimer
25 October 2011 Quantification of critical parameters for a rotational shearing interferometer to detect extrasolar planets
Author Affiliations +
Abstract
There is increasing interest to detect extrasolar planets directly. In the last years, more than 500 planets have been discovered by means of indirect methods. However, the small signal-to-noise ratio and the small angular separation of the star-planet system have hindered the direct detection of the optical / IR signals caused by the planets. Several methods have been proposed to cancel the star irradiance and detecting the presence of the planet around them. One proposal is the rotational shearing interferometer (RSI). Previously, by exact ray trace, we determined the positioning tolerances and the resolution of the fine mirror movements needed to satisfy a maximum wavefront deviation of λ/10 (at 633 nm) in the RSI. In this work, we show a method to quantify, employing exact ray trace and the interference pattern, the critical parameters for this RSI to detect extrasolar planets.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maximiliano Galan, Marija Strojnik, and Gonzalo Paez "Quantification of critical parameters for a rotational shearing interferometer to detect extrasolar planets", Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80112H (25 October 2011); https://doi.org/10.1117/12.903665
PROCEEDINGS
7 PAGES


SHARE
Advertisement
Advertisement
Back to Top