Numerical study of the medium thickness in the Z-scan technique

I. Severiano Carrillo; M. M. Méndez Otero; M. L. Arroyo Carrasco; M. D. Iturbe Castillo

doi:10.1117/12.902201

25 October 2011 Numerical study of the medium thickness in the Z-scan technique

I. Severiano Carrillo, M. M. Méndez Otero, M. L. Arroyo Carrasco, M. D. Iturbe Castillo

Proceedings Volume 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World; 80113L (2011) https://doi.org/10.1117/12.902201
Event: International Commission for Optics (ICO 22), 2011, Puebla, Mexico

Abstract

The optical characterization of nonlinear media through the Z-scan technique considers initially a thin medium (with a thickness much less than the beam depth of focus). It has been observed that increasing the thickness of the medium the transmittance increases, this means that n2 increases, for this reason we will present a numerical model to determinate the minimum thin and the maximum thick medium limit. A thin medium is considered as a thin lens with focal length F¹ and a thick medium can be regarded as a set of such thin lenses set with focal lengths F², these lenses are contained in a medium whit a refraction index different than air. This analysis is made through Matlab using the theory of Gaussian beams, ABCD matrices and the q parameter, elementary theory in the development of this work, where the main feature of this model is that the nonlinearity type of the medium is considered as an integer constant in its focal length³. We present the graphs obtained from Z-scan for thick medium with both thermal and Kerr nonlinearities.

Citation Download Citation

I. Severiano Carrillo, M. M. Méndez Otero, M. L. Arroyo Carrasco, and M. D. Iturbe Castillo "Numerical study of the medium thickness in the Z-scan technique", Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80113L (25 October 2011); https://doi.org/10.1117/12.902201

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KEYWORDS

Transmittance

Nonlinear optics

Gaussian beams

Statistical modeling

Refractive index

Matrices

Photodetectors

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