Lifetime testing results and diagnostic performance prediction of linear coolers at Thales Cryogenics

H. van der Weijden; T. Benschop; W. van de Groep; D. Willems

doi:10.1117/12.886354

Abstract

Thales Cryogenics (TCBV) has an extensive background in delivering long-life cryogenic coolers for military, civil and space programs. During the last years many technical improvements have increased the lifetime of coolers resulting in significantly higher MTTF's. Lifetime endurance tests are used to validate these performance increases. An update will be given on lifetime test of a selection of TCBV's coolers. MTTF figures indicate the statistical average lifetimes for a large population of coolers. However, for the user of IR camera's and spectrometers a detailed view on the performance of an individual cooler and the possible impact of its performance degradation during its lifetime is very important. Thales Cryogenics is developing Cooler Diagnostic Software (CDS), which can be implemented in the firmware of its DSP based cooler drive electronics. With this implemented software the monitoring of the main cooler parameters during the lifetime in the equipment will be possible, including the prediction of the expected cooler performance availability. Based on this software it will be possible to analyze the status of the cooler inside the equipment and, supported by the lifetime knowledge at Thales Cryogenics, make essential choices on the maintenance of equipment and the replacement of coolers. In the paper, we will give an overview of potential situations in which such a predictive algorithm can be used. We will present the required interaction with future users to make an optimal interaction and interpretation of the generated data possible.

Citation Download Citation

H. van der Weijden, H. van der Weijden, T. Benschop, T. Benschop, W. van de Groep, W. van de Groep, D. Willems, D. Willems, } "Lifetime testing results and diagnostic performance prediction of linear coolers at Thales Cryogenics", Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80122N (20 May 2011); doi: 10.1117/12.886354; https://doi.org/10.1117/12.886354

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years