Paper
21 May 2011 Impacts and mitigation strategies of sun exposure on uncooled microbolometer image sensors
David A. Dorn, Oscar Herrera, Curtis Tesdahl, Eric Shumard, Yu-Wei Wang
Author Affiliations +
Abstract
This paper provides results from testing and analysis of sun exposure effects on amorphous silicon (α-Si) microbolometers and vanadium oxide (VOX) microbolometers. Gain and offset changes for each detector type is provided. Results from different sun exposure levels corresponding to different geographic locations and time of year are presented. Data associated with increasing exposure duration and number of exposures is presented. The time constants associated with the sun exposure effects are also provided. Potential mitigation processes and algorithms are explored reducing the impact on image quality. The effectiveness of mitigation processes and algorithms is presented.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David A. Dorn, Oscar Herrera, Curtis Tesdahl, Eric Shumard, and Yu-Wei Wang "Impacts and mitigation strategies of sun exposure on uncooled microbolometer image sensors", Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80123Z (21 May 2011); https://doi.org/10.1117/12.888859
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Sun

Cameras

Microbolometers

Nonuniformity corrections

Camera shutters

Image quality

Image sensors

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