Proceedings Volume 8016 is from: Logo
SPIE DEFENSE, SECURITY, AND SENSING
25-29 April 2011
Orlando, Florida, United States
Front Matter: Volume 8016
Proc. SPIE 8016, Front Matter: Volume 8016, 801601 (11 June 2011); doi: 10.1117/12.901332
Advances in Mid-Wavelength Infrared Window Technology I
Proc. SPIE 8016, Effects and elimination of nanoporosity in transparent sintered spinel (MgAl[sub]2[/sub]O[sub]4[/sub]), 801602 (21 May 2011); doi: 10.1117/12.883958
Proc. SPIE 8016, Manufacturing solutions for polycrystalline transparent spinel domes, 801603 (21 May 2011); doi: 10.1117/12.883073
Proc. SPIE 8016, High-performance spinel ceramics for IR windows and domes, 801604 (21 May 2011); doi: 10.1117/12.883474
Advances in Mid-Wavelength Infrared Window Technology II
Proc. SPIE 8016, ALON optical ceramic transparencies for window, dome, and transparent armor applications, 801608 (21 May 2011); doi: 10.1117/12.886122
Proc. SPIE 8016, High-impact resistance optical sensor windows, 801609 (21 May 2011); doi: 10.1117/12.884518
Proc. SPIE 8016, Dual IR/RF windows for laser communications, 80160A (21 May 2011); doi: 10.1117/12.886111
Proc. SPIE 8016, Transparent ceramics for demanding optical applications, 80160B (21 May 2011); doi: 10.1117/12.884409
Proc. SPIE 8016, Colloidal processing and optical transmittance of submicron polycrystalline alumina, 80160C (21 May 2011); doi: 10.1117/12.884311
Proc. SPIE 8016, Synthesis, characterization, and densification of Al[sub]2-x[/sub]Sc[sub]x[/sub](WO[sub]4[/sub])[sub]3[/sub] ceramics for low-expansion infrared-transparent windows, 80160D (21 May 2011); doi: 10.1117/12.884035
Optical Properties: Measurement and Prediction
Proc. SPIE 8016, A mid-infrared prism coupler for bulk and thin film optical analysis, 80160E (21 May 2011); doi: 10.1117/12.884281
Proc. SPIE 8016, Measurement of chalcogenide glass optical dispersion using a mid-infrared prism coupler, 80160F (21 May 2011); doi: 10.1117/12.884320
Proc. SPIE 8016, Methods for prediction of refractive index in glasses for the infrared, 80160G (21 May 2011); doi: 10.1117/12.882536
Proc. SPIE 8016, Multiphonon difference band absorption in diamond, 80160H (21 May 2011); doi: 10.1117/12.884095
Advances in Long-Wavelength Infrared Window Technology
Proc. SPIE 8016, Anisotropy in structural and optical properties of chemical vapor deposited ZnS, 80160I (21 May 2011); doi: 10.1117/12.886138
Proc. SPIE 8016, Bimodal Weibull statistical analysis of CVD-ZnSe and CVD-ZnS flexural strength data, 80160J (21 May 2011); doi: 10.1117/12.883019
Proc. SPIE 8016, Microwave mediated synthesis of ZnS spherical nanoparticles for IR optical ceramics, 80160K (21 May 2011); doi: 10.1117/12.883557
Proc. SPIE 8016, Single crystal and polycrystalline CVD diamond for demanding optical applications, 80160L (21 May 2011); doi: 10.1117/12.885188
State-of-the Art in Optical Finishing
Proc. SPIE 8016, History of magnetorheological finishing, 80160N (21 May 2011); doi: 10.1117/12.882557
Proc. SPIE 8016, Rapid optical manufacturing of hard ceramic conformal windows and domes, 80160O (21 May 2011); doi: 10.1117/12.883382
Proc. SPIE 8016, Ogive and free-form polishing with ultraform finishing, 80160P (21 May 2011); doi: 10.1117/12.883885
Optical Surface Treatments and Microstructures
Proc. SPIE 8016, Moldable AR microstructures for improved laser transmission and damage resistance in CIRCM fiber optic beam delivery systems, 80160Q (21 May 2011); doi: 10.1117/12.883281
Proc. SPIE 8016, Development of nanostructured protective "sight glasses" for IR gas sensors, 80160S (21 May 2011); doi: 10.1117/12.883921
Proc. SPIE 8016, Laser damage resistant anti-reflection microstructures in Raytheon ceramic YAG, sapphire, ALON, and quartz, 80160T (21 May 2011); doi: 10.1117/12.883272
Proc. SPIE 8016, Numerical comparison of grid pattern diffraction effects through measurement and modeling with OptiScan software, 80160U (21 May 2011); doi: 10.1117/12.883422
Metrology of Free-Form and Conformal Optics
Proc. SPIE 8016, Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe), 80160V (21 May 2011); doi: 10.1117/12.883933
Proc. SPIE 8016, A non-contact surface measurement system for freeform and conformal optics, 80160W (21 May 2011); doi: 10.1117/12.884040
Proc. SPIE 8016, Interferometric tomography: a new tool for metrology on conformal optics, 80160X (21 May 2011); doi: 10.1117/12.887023
Thin Film Optical Coatings and Analysis
Proc. SPIE 8016, Low-loss dual-wave laser optics coatings at 1060 nm and 530 nm, 80160Y (21 May 2011); doi: 10.1117/12.883915
Proc. SPIE 8016, Flexible transparent electrode, 801611 (21 May 2011); doi: 10.1117/12.884008
Back to Top