3 June 2011 Compton imaging with a planar semiconductor system using pulse shape analysis
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Abstract
Homeland security agencies have a requirement to locate and identify nuclear material. Compton cameras [1, 2] offer a more efficient method of gamma-ray detection than collimated detector systems. The resolution of the interaction positions within the detectors greatly influences the accuracy of a reconstructed Compton image. Utilizing digital electronics and applying pulse shape analysis [3] allows the spatial resolution to be enhanced beyond the pixel granularity in three dimensions. Analytically reconstructed Compton images from a range of radiation sources shall be presented with and without pulse shape analysis showing the improvements gained along with a discussion of our analysis methods.
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Anthony Sweeney, Anthony Sweeney, Andrew J. Boston, Andrew J. Boston, Helen C. Boston, Helen C. Boston, John P. Cresswell, John P. Cresswell, Jamie Dormand, Jamie Dormand, Mark Ellis, Mark Ellis, Laura J. Harkness, Laura J. Harkness, Martin Jones, Martin Jones, Daniel S. Judson, Daniel S. Judson, Paul J. Nolan, Paul J. Nolan, David C. Oxley, David C. Oxley, David P. Scraggs, David P. Scraggs, Mike J. Slee, Mike J. Slee, Amandeep Thandi, Amandeep Thandi, } "Compton imaging with a planar semiconductor system using pulse shape analysis", Proc. SPIE 8018, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XII, 80180J (3 June 2011); doi: 10.1117/12.883876; https://doi.org/10.1117/12.883876
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