True nanotechnology, defined as the ability to reliably and repeatably fabricate nanostructures with controlled
differences in size, shape, and orientation at precise substrate locations, currently does not exist. There are many
examples demonstrating the capability to grow, deposit, and manipulate nanometer-sized features, but typically these
techniques do not allow for controllable manufacturing of individual structures. To bridge this gap and to unlock the true
potential of nanotechnology for defense sensing applications, the Defense Advanced Research Projects Agency
(DARPA) launched the Tip-Based Nanofabrication (TBN) research program with the intent of achieving controlled
manufacturing of nanostructures using functionalized AFM cantilevers and tips. This work describes the background,
goals, and recent advances achieved during the multi-year TBN program.