Paper
17 May 2011 Method for steady-state, isothermal measurement of thermoelectric materials
Jay R. Maddux, Patrick J. Taylor
Author Affiliations +
Abstract
A new method for characterizing thermoelectric materials is described. By using non-contact radiative heat flow, parasitic heat flows that will otherwise cause error can be reduced to negligible levels. Having precise knowledge of the steady-state heat flows under conditions with low parasitics allows for accurate determination of thermal conductivity as well as bulk and thin-film device performance metrics including coefficient of performance. Measurement of thermal conductivity of bulk (Bi,Sb)2(Se,Te)3 alloy sample was 1.49 Watt/meter-K.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jay R. Maddux and Patrick J. Taylor "Method for steady-state, isothermal measurement of thermoelectric materials", Proc. SPIE 8035, Energy Harvesting and Storage: Materials, Devices, and Applications II, 803511 (17 May 2011); https://doi.org/10.1117/12.883376
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KEYWORDS
Thermoelectric materials

Temperature metrology

Lead

Copper

Error analysis

Resistance

Thin film devices

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