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1 June 2011Dispersion free all reflective confocal microscope objective
A large numerical aperture (NA in range 0.65-0.8), diffraction limited, broadband (100 nm - 30,000 nm), all-reflective
confocal microscope objective design is discussed. The design is compatible with engineered polarization state of the
excitation beam further decreasing focus spot size. Unlike in the other designs in the proposed system measured sample
does not obscure final reflector. The proposed objective extends spatial and temporal limits of existing novel optical
microscope techniques such as confocal microscopy described, multi-photon microscopy, 4Pi microscopy, I5M
microscopy and others. All reflective design gives promise for high power and high resolution laser-machining
applications.
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Wojtek J. Walecki, Mike Scaggs, Peter S Walecki, Fanny Szondy, "Dispersion free all reflective confocal microscope objective," Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803612 (1 June 2011); https://doi.org/10.1117/12.883385