Dispersion free all reflective confocal microscope objective

Wojtek J. Walecki; Mike Scaggs; Peter S Walecki; Fanny Szondy

doi:10.1117/12.883385

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1 June 2011 Dispersion free all reflective confocal microscope objective

Wojtek J. Walecki; Mike Scaggs; Peter S Walecki; Fanny Szondy

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Proceedings Volume 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences; 803612 (2011) https://doi.org/10.1117/12.883385
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

A large numerical aperture (NA in range 0.65-0.8), diffraction limited, broadband (100 nm - 30,000 nm), all-reflective confocal microscope objective design is discussed. The design is compatible with engineered polarization state of the excitation beam further decreasing focus spot size. Unlike in the other designs in the proposed system measured sample does not obscure final reflector. The proposed objective extends spatial and temporal limits of existing novel optical microscope techniques such as confocal microscopy described, multi-photon microscopy, 4Pi microscopy, I5M microscopy and others. All reflective design gives promise for high power and high resolution laser-machining applications.

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Wojtek J. Walecki, Mike Scaggs, Peter S Walecki, and Fanny Szondy "Dispersion free all reflective confocal microscope objective", Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803612 (1 June 2011); https://doi.org/10.1117/12.883385

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