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Technologies for manufacturing of high angular resolution multilayer coated optics for the New Hard X-ray Mission
Experimental investigations of backward transition radiation characteristics in extreme ultraviolet region
Freestanding multilayer films for application as phase retarders and spectral purity filters in the soft x-ray and EUV ranges
Manufacturing and characterization of diffraction quality normal incidence optics for the XEUV range
Performance benchmark of a gateable microchannel plate detector for extreme ultraviolet radiation with high temporal resolution