4 May 2011 Measurement of characteristics of a XUV capillary laser
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Abstract
This work concerns in measurement of characteristics of a XUV argon capillary laser, which was developed at the Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering. This laser generates at 46.9 nm in Ne - like Ar. Young's double pinhole experiment was realized to estimate spatial coherence of this laser system and to detect the beam profile. We used double pinholes drilled by Ti:saphire laser with four different pinhole separations. pinhole separations were 50 μm, 60 μ m, 100 μm and 150 μm. Apertures had oval shape with diameter 20 - 25 μ m. Interference structure was detected by XUV CCD camera with resolution 512x512 pixels. This work contains also short overview about sources of XUV radiation.
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J. Novak, M. Nevrkla, A. Jancarek, "Measurement of characteristics of a XUV capillary laser", Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 80760L (4 May 2011); doi: 10.1117/12.886758; https://doi.org/10.1117/12.886758
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KEYWORDS
Extreme ultraviolet

Capillaries

Argon ion lasers

Laser development

Laser drilling

Argon

Current controlled current source

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