4 May 2011 Measurement of characteristics of a XUV capillary laser
Author Affiliations +
This work concerns in measurement of characteristics of a XUV argon capillary laser, which was developed at the Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering. This laser generates at 46.9 nm in Ne - like Ar. Young's double pinhole experiment was realized to estimate spatial coherence of this laser system and to detect the beam profile. We used double pinholes drilled by Ti:saphire laser with four different pinhole separations. pinhole separations were 50 μm, 60 μ m, 100 μm and 150 μm. Apertures had oval shape with diameter 20 - 25 μ m. Interference structure was detected by XUV CCD camera with resolution 512x512 pixels. This work contains also short overview about sources of XUV radiation.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Novak, M. Nevrkla, A. Jancarek, "Measurement of characteristics of a XUV capillary laser", Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 80760L (4 May 2011); doi: 10.1117/12.886758; https://doi.org/10.1117/12.886758


Beam characteristics of CAPEX XUV argon laser
Proceedings of SPIE (September 27 2013)
Coherent soft x-ray sources for users
Proceedings of SPIE (October 05 2011)
Small scale soft x ray laser excited by a fast...
Proceedings of SPIE (September 15 1995)
Repetitive XUV laser based on the fast capillary discharge
Proceedings of SPIE (October 05 2011)

Back to Top