Modeling of soft x-ray induced ablation in solids

B. Iwan; J. Andreasson; E. Abreu; M. Bergh; C. Caleman; J. Hajdu; N. Tîmneanu

doi:10.1117/12.888988

18 May 2011 Modeling of soft x-ray induced ablation in solids

B. Iwan, J. Andreasson, E. Abreu, M. Bergh, C. Caleman, J. Hajdu, N. Tîmneanu

Proceedings Volume 8077, Damage to VUV, EUV, and X-ray Optics III; 807705 (2011) https://doi.org/10.1117/12.888988
Event: SPIE Optics + Optoelectronics, 2011, Prague, Czech Republic

Abstract

Powerful free electron lasers (FELs) operating in the soft X-ray regime are offering new possibilities for creating and probing materials under extreme conditions. We describe here simulations to model the interaction of a focused FEL pulse with metallic solids (niobium, vanadium, and their deuterides) at 13.5 nm wavelength (92 eV) with peak intensities between 10¹⁵ to 10¹⁸ W/cm² and a fixed pulse length of 15 femtoseconds (full width at half maximum). The interaction of the pulse with the metallic solids was modeled with a non-local thermodynamic equilibrium code that included radiation transfer. The calculations also made use of a self-similar isothermal fluid model for plasma expansion into vacuum. We find that the time-evolution of the simulated critical charge density in the sample results in a critical depth that approaches the observed crater depths in an earlier experiment performed at the FLASH free electron laser in Hamburg. The results show saturation in the ablation process at intensities exceeding 10¹⁶ W/cm². Furthermore, protons and deuterons with kinetic energies of several keV have been measured, and these concur with predictions from the plasma expansion model. The results indicate that the temperature of the plasma reached almost 5 million K after the pulse has passed.

Citation Download Citation

B. Iwan, J. Andreasson, E. Abreu, M. Bergh, C. Caleman, J. Hajdu, and N. Tîmneanu "Modeling of soft x-ray induced ablation in solids", Proc. SPIE 8077, Damage to VUV, EUV, and X-ray Optics III, 807705 (18 May 2011); https://doi.org/10.1117/12.888988

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