Characterization and diagnostics of fast x-ray imaging detectors for x-ray free electron laser sources

Andrea Castoldi; Chiara Guazzoni; Davide Mezza; Luca Carraresi; Francesco Taccetti

doi:10.1117/12.888027

20 May 2011 Characterization and diagnostics of fast x-ray imaging detectors for x-ray free electron laser sources

Andrea Castoldi, Chiara Guazzoni, Davide Mezza, Luca Carraresi, Francesco Taccetti

Proceedings Volume 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation; 80780P (2011) https://doi.org/10.1117/12.888027
Event: SPIE Optics + Optoelectronics, 2011, Prague, Czech Republic

Abstract

The current development of novel fast X-ray imagers for X-ray Free Electron Laser (XFEL) radiation sources raises the need for suitable characterization tools for studying and qualifying detector performance over a wide range of injection levels. In particular it is needed to assess detector's timing properties and achievable spatial resolution through a detailed 2D mapping of the detector response at any level of charge injection. To this aim a high-dynamic range test suite has been devised and implemented. At the lower levels of charge injection the stimulus comes from a laser test bench, while for the higher levels of charge injection we make use of mono-energetic proton bunches. Deconvolution methods have been developed for the detector output waveforms in order to gain deeper insight on detector behavior. This paper will discuss the potential of the developed suite as a diagnostic tool for mapping the response of the detectorfrontend system in charge, time and space at high resolution through the illustration of an extended qualification campaign carried out on a prototype of Multi Linear Silicon Drift Detector with high readout speed.

Citation Download Citation

Andrea Castoldi, Chiara Guazzoni, Davide Mezza, Luca Carraresi, and Francesco Taccetti "Characterization and diagnostics of fast x-ray imaging detectors for x-ray free electron laser sources", Proc. SPIE 8078, Advances in X-ray Free-Electron Lasers: Radiation Schemes, X-ray Optics, and Instrumentation, 80780P (20 May 2011); https://doi.org/10.1117/12.888027

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