27 May 2011 High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles
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Abstract
We have developed a high-sensitivity, low-coherence dynamic light scattering system for the measurement of particles a few tens of nanometers in size. A Mach-Zehnder interferometer and a confocal optical system were adopted for improved sensitivity to scattered light intensity. The developed system can detect scattered light 3000 times weaker than that detectable by a previous system. We applied the newly developed system to measure the particle size distribution of 10 vol.% polystyrene particles with an average diameter of 13 nm. The obtained particle size distribution agreed quite well with a distribution determined by transmission electron microscopy.
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Katsuhiro Ishii, Katsuhiro Ishii, Sohichiro Nakamura, Sohichiro Nakamura, Yuki Sato, Yuki Sato, } "High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821Z (27 May 2011); doi: 10.1117/12.889305; https://doi.org/10.1117/12.889305
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