High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles

Katsuhiro Ishii; Sohichiro Nakamura; Yuki Sato

doi:10.1117/12.889305

27 May 2011 High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles

Katsuhiro Ishii, Sohichiro Nakamura, Yuki Sato

Author Affiliations +

Proceedings Volume 8082, Optical Measurement Systems for Industrial Inspection VII; 80821Z (2011) https://doi.org/10.1117/12.889305
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

We have developed a high-sensitivity, low-coherence dynamic light scattering system for the measurement of particles a few tens of nanometers in size. A Mach-Zehnder interferometer and a confocal optical system were adopted for improved sensitivity to scattered light intensity. The developed system can detect scattered light 3000 times weaker than that detectable by a previous system. We applied the newly developed system to measure the particle size distribution of 10 vol.% polystyrene particles with an average diameter of 13 nm. The obtained particle size distribution agreed quite well with a distribution determined by transmission electron microscopy.

Citation Download Citation

Katsuhiro Ishii, Katsuhiro Ishii, Sohichiro Nakamura, Sohichiro Nakamura, Yuki Sato, Yuki Sato, "High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821Z (27 May 2011); doi: 10.1117/12.889305; https://doi.org/10.1117/12.889305

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