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27 May 2011 Mueller matrix imaging of plasmonic polarizers on nanopatterned surface
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Abstract
We present the application of a near infra red Mueller matrix imaging ellipsometer to the characterization of plasmonic polarizers. The samples are prepared by evaporation of Au onto SiO2 ripples. The nanostructured ripple surface has been produced by ion beam sputtering at an off normal angle of incidence. Au was thereafter evaporated onto the surface at an grazing angle. As a result, thin lines of nearly connected Au nanoparticles form along the illuminated side of the ripples, resulting in a large in-plane anisotropy of the structure. Mueller matrix imaging is used to determine the lateral uniformity of the optical signal in correlation to the real space topography of the sample, and to determine to what degree the nanoparticles tend to form a connected wire, or whether there are well separated Au particles. The success of this method in order to produce polarizers, lies in controlling the process to allow well connected lines of Au particles along the ripples, with a high degree of homogeneity. Mueller Matrix images of the sample recorded at normal incidence are shown, and the information that can be extracted from such images is discussed.
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Lars Martin S. Aas, Ingar Stian Nerbø, Morten Kildemo, Daniele Chiappe, Christian Martella, and Francesco Buatier de Mongeot "Mueller matrix imaging of plasmonic polarizers on nanopatterned surface", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80822W (27 May 2011); https://doi.org/10.1117/12.889585
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