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27 May 2011 Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces
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Abstract
Grinding processes causes the formation of a characteristic surface structure, known as chatter marks. In this work, an angle-resolved light scattering technique is used to characterise them. In order to identify the chatter marks in a measured profile, the fast Fourier transform (FFT) is usually applied to the measured data. The FFT, however only for strictly periodic data yields unambiguous results. To overcome this, the multiresolution analysis (MRA) is also applied by means of the lifting scheme. In this manner, it is shown that chatter marks, for example, can be uniquely identified by applying the multiresolution analysis to the angle-resolved light scattering data, even when FFT fails to do this. Thus MRA alone or alternatively in combination with FFT, opens new opportunities for optical online control in case of industrial surface finishing processes.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. A. Böhm, A. Vernes, G. Vorlaufer, and M. J. Vellekoop "Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808238 (27 May 2011); https://doi.org/10.1117/12.889488
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