23 May 2011 Speckle pattern simulations for in-plane displacement measurements
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In this paper, we describe a theoretical model, which allows simulating speckle pattern in an imaging system and its detection by an image sensor with a limited number of pixels. This simulation tool is based on the Fourier Optics theory. Preliminary tests show a very good agreement between simulations and experiments. We have demonstrated experimentally and theoretically that sub-micrometer displacement resolution is possible by means of the crosscorrelation of speckle patterns, over a range limited to half of the field-of-view of the imaging system.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yves Salvadé, Yves Salvadé, Romain Bonjour, Romain Bonjour, "Speckle pattern simulations for in-plane displacement measurements", Proc. SPIE 8083, Modeling Aspects in Optical Metrology III, 80830H (23 May 2011); doi: 10.1117/12.889789; https://doi.org/10.1117/12.889789


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