20 September 2011 Plasmons in nanoscale metal junctions: optical rectification and thermometry
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Abstract
We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and photocurrents allows us to infer the optical frequency potential difference produced by the plasmon response of the junction. Together with the measured tunneling conductance, we can then determine the locally enhanced electric field within the junction. In similar structures containing molecules, anti-Stokes and Stokes Raman emission allow us to infer the effective local vibrational and electronic temperatures as a function of DC current, examining heating and dissipation on the nanometer scale.
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Douglas Natelson, Douglas Natelson, Daniel R. Ward, Daniel R. Ward, Falco Hüser, Falco Hüser, Fabian Pauly, Fabian Pauly, Juan Carlos Cuevas, Juan Carlos Cuevas, David A. Corley, David A. Corley, James M. Tour, James M. Tour, } "Plasmons in nanoscale metal junctions: optical rectification and thermometry", Proc. SPIE 8096, Plasmonics: Metallic Nanostructures and Their Optical Properties IX, 80961O (20 September 2011); doi: 10.1117/12.892328; https://doi.org/10.1117/12.892328
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