Paper
9 September 2011 Opto-mechanical force measurement of deep sub-wavelength plasmonic modes
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Abstract
Spatial mapping of optical force near the hot-spot of a metal-dielectric-metal bow-tie nanoantenna at a wavelength of 1550 nm is presented. Non contact mode atomic force microscopy is used with a lock-in method to produce the map. Maxwell's stress tensor method has also been used to simulate the force produced by the bow-tie and it agrees with the experimental data. If dual lock-in amplifiers are used, this method could potentially produce the near field intensity and optical force map simultaneously, both with high spatial resolution. Detailed mapping of the optical force is critical for many emerging applications such as plasmonic biosensing and optomechanical switching.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Kohoutek, Dibyendu Dey, Alireza Bonakdar, Alejandro Sklar, Omer Gokalp Memis, Ryan Gelfand, and Hooman Mohseni "Opto-mechanical force measurement of deep sub-wavelength plasmonic modes", Proc. SPIE 8097, Optical Trapping and Optical Micromanipulation VIII, 80971T (9 September 2011); https://doi.org/10.1117/12.891888
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KEYWORDS
Near field optics

Atomic force microscopy

Antennas

Near field

Plasmonics

Near field scanning optical microscopy

Optical amplifiers

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