Using a single anisotropic thin film as a phase retarder for oblique incident wave

Yi-Jun Jen; Shih-Hao Wang; Chia-Feng Lin; Meng-Jie Lin

doi:10.1117/12.894338

26 September 2011 Using a single anisotropic thin film as a phase retarder for oblique incident wave

Yi-Jun Jen, Shih-Hao Wang, Chia-Feng Lin, Meng-Jie Lin

Proceedings Volume 8104, Nanostructured Thin Films IV; 81040A (2011) https://doi.org/10.1117/12.894338
Event: SPIE NanoScience + Engineering, 2011, San Diego, California, United States

Abstract

This work presents a wide angle phase retarder by using a single anisotropic Ta₂O₅ columnar thin film. The single anisotropic Ta₂O₅ columnar thin film can provide phase retardation between two tangential eigenvectors to modulate the polarization state of light reflected from the prism-coupling system (BK7 prism/anisotropic thin film/air). In experiment, glancing angle deposition technique is used to prepare single layer film of Ta₂O₅ tilted nanorod array with thickness 270nm. In this analysis, we use wave tracing based on the Berreman calculus to calculate the variations of phases of eigen-waves in the anisotropic thin film as the electromagnetic wave is incident to the prism-coupling system. The uniform phase retardation can be observed in a wide angle range. A linearly polarized incident ray can be reflected as a specific elliptical polarized ray uniformly over the range. Similarly, the wide angle and broadband polarization conversion reflectance with high efficiency also exists in the single anisotropic Ta₂O₅ columnar thin film. The single anisotropic Ta₂O₅ columnar thin film can be useful for the further application in optical components design.

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Yi-Jun Jen, Shih-Hao Wang, Chia-Feng Lin, and Meng-Jie Lin "Using a single anisotropic thin film as a phase retarder for oblique incident wave", Proc. SPIE 8104, Nanostructured Thin Films IV, 81040A (26 September 2011); https://doi.org/10.1117/12.894338

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KEYWORDS

Thin films

Reflectivity

Wave plates

Interfaces

Polarization

Phase shift keying

Tantalum

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