Nanoparticles and metrology: a comparison of methods for the determination of particle size distributions

Victoria A. Coleman; Åsa K. Jämting; Heather J. Catchpoole; Maitreyee Roy; Jan Herrmann

doi:10.1117/12.894297

20 September 2011 Nanoparticles and metrology: a comparison of methods for the determination of particle size distributions

Victoria A. Coleman, Åsa K. Jämting, Heather J. Catchpoole, Maitreyee Roy, Jan Herrmann

Author Affiliations +

Proceedings Volume 8105, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V; 810504 (2011) https://doi.org/10.1117/12.894297
Event: SPIE NanoScience + Engineering, 2011, San Diego, California, United States

Abstract

Nanoparticles and products incorporating nanoparticles are a growing branch of nanotechnology industry. They have found a broad market, including the cosmetic, health care and energy sectors. Accurate and representative determination of particle size distributions in such products is critical at all stages of the product lifecycle, extending from quality control at point of manufacture to environmental fate at the point of disposal. Determination of particle size distributions is non-trivial, and is complicated by the fact that different techniques measure different quantities, leading to differences in the measured size distributions. In this study we use both mono- and multi-modal dispersions of nanoparticle reference materials to compare and contrast traditional and novel methods for particle size distribution determination. The methods investigated include ensemble techniques such as dynamic light scattering (DLS) and differential centrifugal sedimentation (DCS), as well as single particle techniques such as transmission electron microscopy (TEM) and microchannel resonator (ultra high-resolution mass sensor).

Citation Download Citation

Victoria A. Coleman, Åsa K. Jämting, Heather J. Catchpoole, Maitreyee Roy, and Jan Herrmann "Nanoparticles and metrology: a comparison of methods for the determination of particle size distributions", Proc. SPIE 8105, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V, 810504 (20 September 2011); https://doi.org/10.1117/12.894297

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available