26 September 2011 Phase-shifting Zernike interferometer wavefront sensor
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Abstract
The canonical Zernike phase-contrast technique transforms a phase object in one plane into an intensity object in the conjugate plane. This is done by applying a static π/2 phase shift to the central core (~ λ/D) of the PSF which is intermediate between the input and output planes. Here we present a new architecture for this sensor. First, the optical system is simple and all reflective. Second, the phase shift in the central core of the PSF is dynamic and or arbitrary size. This common-path, all-reflective design makes it minimally sensitive to vibration, polarization and wavelength. We review the theory of operation, describe the optical system, summarize numerical simulations and sensitivities and review results from a laboratory demonstration of this novel instrument.
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J. Kent Wallace, J. Kent Wallace, Shanti Rao, Shanti Rao, Rebecca M. Jensen-Clem, Rebecca M. Jensen-Clem, Gene Serabyn, Gene Serabyn, } "Phase-shifting Zernike interferometer wavefront sensor", Proc. SPIE 8126, Optical Manufacturing and Testing IX, 81260F (26 September 2011); doi: 10.1117/12.892843; https://doi.org/10.1117/12.892843
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