1 January 1987 Phase Measuring Interferometry With A Tunable Semiconductor Laser
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Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967128
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada
Abstract
Several authors1'2) have developed a digital heterodyne or a fringe-scanning interferometry employing the phase shifter such as a piezoelectric transducer (PZT). Recently semiconductor lasers (LD's) are usable and potentially reliable for key devices in optics. One of the features of LD is tunability, in which the wavelength of a single-mode laser can be changed continuously by the variation of the injection current and/or the temperature of active region. Therefore, it is possible to consider that a phase measuring interferometry can be realized by changing the relative phase difference between the two beams of the interferometer with the frequency modulation of
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Ishii, Y. Ishii, J. Chen, J. Chen, K. Murata, K. Murata, } "Phase Measuring Interferometry With A Tunable Semiconductor Laser", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); doi: 10.1117/12.967128; https://doi.org/10.1117/12.967128
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