Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems

J. M. Woznicki

doi:10.1117/12.967278

1 January 1987 Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems

J. M. Woznicki

Proceedings Volume 0813, Optics and the Information Age; (1987) https://doi.org/10.1117/12.967278
Event: 14th Congress of the International Commission for Optics, 1987, Quebec, Canada

Abstract

Progress of computational methods in electron optics makes possible to determine focusing properties of real electron-optical systems by means of electron trajectories analysis (e.g.U] ). These problems have essential practical meaning in optics in general. For real optical systems the rays method of the image properties analysis seems to be useful.

Citation Download Citation

J. M. Woznicki "Statistical-Image-Surface Conception In Analysis Of Electrostatic Electron-Optical Imaging Systems", Proc. SPIE 0813, Optics and the Information Age, (1 January 1987); https://doi.org/10.1117/12.967278

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