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9 September 2011 Color pattern projection method for three-dimensional measurement
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Three-dimensional measurement based on a pattern projection method has a lot of requirements such as inspections, evaluations and designings in the fields of industry. We have proposed a projection technique using a single MEMS mirror and a laser diode to realize a compact camera for three-dimensional measurement. This projection technique is able to be transformed the mechanism of the projection from time domain to spatial domain. From this technique, we achieved to develop a palm-top camera for three-dimensional profile measurement. In this paper, we propose recent improvement of the principle and its applications. We have developed three-dimensional measurement method based on a single MEMS mirror using three-color laser diodes and 3CCD camera. The measurement method has combined the merits of pattern projection method with the merits of gray code technique.
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Toshitaka Wakayama and Toru Yoshizawa "Color pattern projection method for three-dimensional measurement", Proc. SPIE 8133, Dimensional Optical Metrology and Inspection for Practical Applications, 81330A (9 September 2011);

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