28 September 2011 Application of focusing x-ray spectrograph with spatial resolution and uniform dispersion in Z-pinch plasmas measurement
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Abstract
Application of focusing x-ray spectrograph with spatial resolution and uniform dispersion in measurement of the imploding Al wire array z-pinch plasma is reported. Uniform dispersion (i.e., the linear dispersion is a constant, or in other words, the x-rays are dispersed on the detector with uniform spacing for every wavelength) is realized by bending the crystal of a spectrograph into a special shape. Since the spatial coordinate of the spectrum obtained by this spectrograph varies linearly with x-ray wavelength, it is very convenient for identification and processing of the experimental spectrum. The experimental results show that this spectrograph has high luminosity, high spectral and spatial resolution and is very suitable for the routine spectrum measurement on the Z-pinch facility or other high-energy-density-physics (HEDP) facilities.
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Qingguo Yang, Qingguo Yang, Yan Ye, Yan Ye, Guanghua Chen, Guanghua Chen, Zeren Li, Zeren Li, Qixian Peng, Qixian Peng, } "Application of focusing x-ray spectrograph with spatial resolution and uniform dispersion in Z-pinch plasmas measurement", Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 81390M (28 September 2011); doi: 10.1117/12.892292; https://doi.org/10.1117/12.892292
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