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28 September 2011 Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines
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Abstract
New physical-vapor-deposited (PVD) beryllium foils were characterized using coherent x-rays at the 1-km-long beamline in the SPring-8. Non-uniformity in the 150 μmx150 μm area is 3% (rms) for 0.1-nm x-rays and 5% for 0.15-nm x-rays which are almost similar value to that of previous PVD foils. The PVD beryllium foil has a capability for synchrotron radiation and x-ray free electron laser applications with spatially coherent x-rays.
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Shunji Goto, Sunao Takahashi, Yuichi Inubushi, Kensuke Tono, Takahiro Sato, and Makina Yabashi "Characterization of beryllium foils for coherent x-ray applications of synchrotron radiation and XFEL beamlines", Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 813910 (28 September 2011); https://doi.org/10.1117/12.894506
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