5 October 2011 A single-shot intensity-position monitor for hard x-ray FEL sources
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Abstract
An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 μm, limited only by the Poisson statistics of the X-rays collected in a single shot.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yiping Feng, Jan M Feldkamp, David M. Fritz, Marco Cammarata, Robert Aymeric, Chiara Caronna, Henrik T. Lemke, Diling Zhu, Sooheyong Lee, Sebastien Boutet, Garth Williams, Kensuke Tono, Makina Yabashi, Jerome B. Hastings, "A single-shot intensity-position monitor for hard x-ray FEL sources", Proc. SPIE 8140, X-ray Lasers and Coherent X-ray Sources: Development and Applications IX, 81400Q (5 October 2011); doi: 10.1117/12.893740; https://doi.org/10.1117/12.893740
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