5 October 2011 A single-shot intensity-position monitor for hard x-ray FEL sources
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Abstract
An inline diagnostics device was developed to measure the intrinsic shot-to-shot intensity and position fluctuations of the SASE-based LCLS hard X-ray FEL source. The device is based on the detection of back-scattered X-rays from a partially-transmissive thin target using a quadrant X-ray diode array. This intensity and position monitor was tested for the first time with FEL X-rays on the XPP instrument of the LCLS. Performance analyses showed that the relative precision for intensity measurements approached 0.1% and the position sensitivity was better than 5 μm, limited only by the Poisson statistics of the X-rays collected in a single shot.
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Yiping Feng, Yiping Feng, Jan M Feldkamp, Jan M Feldkamp, David M. Fritz, David M. Fritz, Marco Cammarata, Marco Cammarata, Robert Aymeric, Robert Aymeric, Chiara Caronna, Chiara Caronna, Henrik T. Lemke, Henrik T. Lemke, Diling Zhu, Diling Zhu, Sooheyong Lee, Sooheyong Lee, Sebastien Boutet, Sebastien Boutet, Garth Williams, Garth Williams, Kensuke Tono, Kensuke Tono, Makina Yabashi, Makina Yabashi, Jerome B. Hastings, Jerome B. Hastings, } "A single-shot intensity-position monitor for hard x-ray FEL sources", Proc. SPIE 8140, X-ray Lasers and Coherent X-ray Sources: Development and Applications IX, 81400Q (5 October 2011); doi: 10.1117/12.893740; https://doi.org/10.1117/12.893740
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