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23 September 2011 Undulator emission analysis: comparison between measurements and simulations
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Abstract
The X-ray emission of the HU52 Apple2 undulator of the SOLEIL DEIMOS (Dichroism Experimental Installation for Magneto-Optical Spectroscopy) beamline is analyzed using the Bragg diffraction of a Si(111) crystal at various undulator gaps in linear horizontal polarization. Measurements are compared with simulations in order to determine undulator properties. The method allows also to get information on the electron beam.
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Thierry Moreno, Edwige Otero, Xiaohao Dong, and Philippe Ohresser "Undulator emission analysis: comparison between measurements and simulations", Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 81410H (23 September 2011); https://doi.org/10.1117/12.893778
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