23 September 2011 Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case
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Abstract
Optical design of hard x-ray beamlines can be accurately performed through ray tracing simulation technique. We describe here the way and the tools we use at SOLEIL to develop hard x-ray beamlines such as PSICHÉ, which is a wiggler beamline performing diffraction and tomography experiments from 20 to 50 keV. This beamline is made of two focusing stages, one with a long vertical focusing mirror together with a sagittal focusing crystal monochromator to gain a spot of 100x50 μm and the other one applying a set of graded multilayer KB mirrors to reach 10x10 μm spot. Ray tracing simulations are performed with SpotX, which provides optical properties of the beamline taking into account thermal load on optics, surface polishing defects from the profilometer measurements.
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Xiaohao Dong, Xiaohao Dong, Thierry Moreno, Thierry Moreno, Nicolas Guignot, Nicolas Guignot, Jean-Paul Itié, Jean-Paul Itié, } "Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case", Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 814113 (23 September 2011); doi: 10.1117/12.893643; https://doi.org/10.1117/12.893643
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