Paper
22 September 2011 Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors
A. E. Bolotnikov, J. Butcher, G. S. Camarda, Y. Cui, S. U. Egarievwe, P. M. Fochuk, R. Gul, M. Hamade, A. Hossain, K. Kim, O. V. Kopach, M. Petryk, B. Raghothamachar, G. Yang, R. B. James
Author Affiliations +
Abstract
CdZnTe (CZT) crystals used for nuclear-radiation detectors often contain high concentrations of subgrain boundaries and networks of poligonized dislocations that can significantly degrade the performance of semiconductor devices. These defects exist in all commercial CZT materials, regardless of their growth techniques and their vendor. We describe our new results from examining such detectors using IR transmission microscopy and white X-ray beam diffraction topography. We emphasize the roles on the devices' performances of networks of subgrain boundaries with low dislocation densities, such as poligonized dislocations and mosaic structures. Specifically, we evaluated their effects on the gamma-ray responses of thick, >10 mm, CZT detectors. Our findings set the lower limit on the energy resolution of CZT detectors containing dense networks of subgrain boundaries and walls of dislocations.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. E. Bolotnikov, J. Butcher, G. S. Camarda, Y. Cui, S. U. Egarievwe, P. M. Fochuk, R. Gul, M. Hamade, A. Hossain, K. Kim, O. V. Kopach, M. Petryk, B. Raghothamachar, G. Yang, and R. B. James "Effects of the networks of subgrain boundaries on spectral responses of thick CdZnTe detectors", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814206 (22 September 2011); https://doi.org/10.1117/12.896223
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Cited by 6 scholarly publications.
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KEYWORDS
Sensors

Crystals

Clouds

X-ray microscopy

X-rays

Infrared microscopy

Infrared sensors

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