27 September 2011 Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors
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Abstract
CR-39 detectors were exposed to DT neutrons generated by a Thermo Fisher model A290 neutron generator. Afterwards, the etched tracks were examined both optically and by scanning electron microscopy (SEM). The purpose of the analysis was to compare the two techniques and to determine whether additional information on track geometry could be obtained by SEM analysis. The use of these techniques to examine triple tracks, diagnostic of ≥9.6 MeV neutrons, observed in CR-39 used in Pd/D co-deposition experiments will also be discussed.
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P. A. Mosier-Boss, P. A. Mosier-Boss, L. P. G. Forsley, L. P. G. Forsley, P. Carbonnelle, P. Carbonnelle, M. S. Morey, M. S. Morey, J. R. Tinsley, J. R. Tinsley, J. P. Hurley, J. P. Hurley, F. E. Gordon, F. E. Gordon, } "Comparison of SEM and optical analysis of DT neutron tracks in CR-39 detectors", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81420K (27 September 2011); doi: 10.1117/12.896953; https://doi.org/10.1117/12.896953
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