27 September 2011 Effects of thermal annealing on the structural properties of CdZnTe crystals
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Abstract
Although cadmium zinc telluride (CZT) is one of leading materials for fabricating room-temperature nuclear-radiation- detectors, different defects in the crystals can degrade the performance of CZT detectors. Post-growth thermal annealing potentially offers a satisfactory way to eliminate the deleterious influence of these defects. Here, we report that the annealing of CZT in Cd vapor effectively lowers the density of Te inclusions. It takes a much longer annealing time to eliminate separate large Te inclusions than small ones; however, the annealing time is greatly reduced when the large Te inclusions are distributed along grain boundaries. We found that sub-grain boundaries still exist after the annealing at 500 °C, indicating that a higher annealing temperature might be needed.
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G. Yang, A. E. Bolotnikov, P. M. Fochuk, Y. Cui, G. S. Camarda, A. Hossain, K. H. Kim, J. Horace, B. McCall, R. Gul, O. V. Kopach, S. U. Egarievwe, R. B. James, "Effects of thermal annealing on the structural properties of CdZnTe crystals", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 814217 (27 September 2011); doi: 10.1117/12.894961; https://doi.org/10.1117/12.894961
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