Correlations of secondary phases (SPs) with mobility lifetime (&#956;&#964;e) of the electrons in CZT crystals using IR microscopy

Sachin Bhaladhare; W. Gitau Munge II; Santosh Swain; Amlan Datta; Cody James Havrilak; Raji Soundararajan; Kelly Jones; Martine C. Duff; K. G. Lynn

doi:10.1117/12.894643

27 September 2011 Correlations of secondary phases (SPs) with mobility lifetime (μτ_e) of the electrons in CZT crystals using IR microscopy

Sachin Bhaladhare, W. Gitau Munge II, Santosh Swain, Amlan Datta, Cody James Havrilak, Raji Soundararajan, Kelly Jones, Martine C. Duff, K. G. Lynn

Author Affiliations +

Proceedings Volume 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII; 81421O (2011) https://doi.org/10.1117/12.894643
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Cadmium Zinc Telluride (CdZnTe/CZT) crystals were grown using a modified vertical Bridgman growth technique with 10 % Zn concentration at Washington State University (WSU). Analyses of the effects of volume (vol.) %, number density (cm^-3), mean diameter (μm) of secondary phases (SPs) and thickness (mm) of the CZT crystals on single crystal properties such as carrier mobility lifetime (μτ_e) and resistivity (ρ) were performed. Some correlations were observed between μτ_e values of different CZT crystals and vol. %, number density, mean diameter of SPs and thickness of the crystals. High μτ_e and lower SP vol. % values were obtained for the ingots grown with rapid cool down times and with no intentional amounts of excess Te/Cd. For the selected samples, the effects of the SPs on the μτ_e values were established for the SPs whose mean diameters were ≤4 μm and >4 μm. These studies indicate vol. % and mean diameter of SPs are the important parameters for CZT crystal performance as a radiation detector.

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Sachin Bhaladhare, W. Gitau Munge II, Santosh Swain, Amlan Datta, Cody James Havrilak, Raji Soundararajan, Kelly Jones, Martine C. Duff, and K. G. Lynn "Correlations of secondary phases (SPs) with mobility lifetime (μτ_e) of the electrons in CZT crystals using IR microscopy", Proc. SPIE 8142, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIII, 81421O (27 September 2011); https://doi.org/10.1117/12.894643

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