13 September 2011 Defect creation by swift heavy ion induced secondary electrons
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Evolution of c-axis oriented YBa2Cu3O7-y (YBCO) thin films under 200 MeV Ag ion irradiation at 79 K is studied by in-situ temperature dependent resistivity and in-situ low temperature x-ray diffraction. The electronic energy loss (25.18 keV nm-1) of these ions is shown to induce secondary electrons, which create oxygen disorder selectively in the CuO basal planes of fully oxygenated YBCO in a cylindrical region of radius 97 nm around the ion induced latent tracks of radius 1.9 nm. This technique provides a unique way of creating oxygen disorder in a fully oxygenated YBCO, which was not possible earlier.
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Naresh C. Mishra, Naresh C. Mishra, Rajib Biswal, Rajib Biswal, Dinakar Kanjilal, Dinakar Kanjilal, Devesh K. Avasthi, Devesh K. Avasthi, } "Defect creation by swift heavy ion induced secondary electrons", Proc. SPIE 8144, Penetrating Radiation Systems and Applications XII, 814406 (13 September 2011); doi: 10.1117/12.893025; https://doi.org/10.1117/12.893025

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