12 October 2011 Grazing incidence wavefront sensing and verification of x-ray optics performance
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Proceedings Volume 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V; 814717 (2011); doi: 10.1117/12.893404
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States
Abstract
Evaluation of interferometric mirror metrology data and characterization of a telescope wavefront can be powerful tools in understanding image characteristics of an x-ray optical system. In the development of soft x-ray telescope for the International X-Ray Observatory (IXO), we have developed new approaches to support the telescope development process. Interferometrically measuring the optical components over all relevant spatial frequencies can be used to evaluate and predict the performance of an x-ray telescope. Typically, the mirrors are measured using a mount that minimizes the mount and gravity induced errors. In the assembly and mounting process the shape of the mirror segments can dramatically change. We have developed wavefront sensing techniques suitable for the x-ray optical components to aid us in the characterization and evaluation of these changes. Hartmann sensing of a telescope and its components is a simple method that can be used to evaluate low order mirror surface errors and alignment errors. Phase retrieval techniques can also be used to assess and estimate the low order axial errors of the primary and secondary mirror segments. In this paper we describe the mathematical foundation of our Hartmann and phase retrieval sensing techniques. We show how these techniques can be used in the evaluation and performance prediction process of x-ray telescopes.
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Timo T. Saha, Scott Rohrbach, William W. Zhang, Tyler C. Evans, Melinda Hong, "Grazing incidence wavefront sensing and verification of x-ray optics performance", Proc. SPIE 8147, Optics for EUV, X-Ray, and Gamma-Ray Astronomy V, 814717 (12 October 2011); doi: 10.1117/12.893404; https://doi.org/10.1117/12.893404
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KEYWORDS
Mirrors

Image segmentation

Telescopes

X-ray telescopes

Metrology

X-ray optics

X-rays

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