7 October 2011 Development of multilayer thin film filters for the full-sun imager on Solar Orbiter
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Proceedings Volume 8148, Solar Physics and Space Weather Instrumentation IV; 81480N (2011); doi: 10.1117/12.893355
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States
Abstract
Membranes a few hundred nanometers thick are used in EUV optics to make, for example, beams splitters or passband filters. Despite their necessity in numerous applications these components are, because of their thinness, extremely fragile and their implementation in space instruments is always difficult. The authors are developing thin film filters for the Full Sun Imager, one of the EUV telescopes on board the Solar Orbiter mission with objectives of high optical efficiency and mechanical strength. These filters are specifically designed to isolate one or the other of the two passbands (17.4 and 30.4 nm) reflected by the telescope's dual band mirror coating. In this paper we present the optical properties of the prototype components.
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Frédéric Auchère, Xueyan Zhang, Franck Delmotte, Evgueni Meltchakov, Ali BenMoussa, "Development of multilayer thin film filters for the full-sun imager on Solar Orbiter", Proc. SPIE 8148, Solar Physics and Space Weather Instrumentation IV, 81480N (7 October 2011); doi: 10.1117/12.893355; https://doi.org/10.1117/12.893355
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KEYWORDS
Transmittance

Imaging systems

Optical filters

Multilayers

Thin films

Aluminum

Extreme ultraviolet

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